Noise measurements for the performance analysis of infrared photodetectors
| Autor: | R. Taalat, M. Delmas, Philippe Christol, Michel Tauvy, E. Giard, Isabelle Ribet-Mohamed, Marcel Caes, B.-L Nghiem, Jean-Baptiste Rodriguez |
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| Přispěvatelé: | ONERA - The French Aerospace Lab [Palaiseau], ONERA-Université Paris Saclay (COmUE), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Composants à Nanostructure pour le moyen infrarouge (NANOMIR), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2013 |
| Předmět: |
Physics::Instrumentation and Detectors
Analog-to-digital converter Photodetector 02 engineering and technology 7. Clean energy 01 natural sciences Noise (electronics) law.invention Optics law 0103 physical sciences Image noise Flicker noise [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ComputingMilieux_MISCELLANEOUS 010302 applied physics Physics Noise measurement business.industry Shot noise 021001 nanoscience & nanotechnology Photodiode [SPI.TRON]Engineering Sciences [physics]/Electronics Optoelectronics 0210 nano-technology business |
| Zdroj: | 2013 International Conference on Noise and Fluctuations (ICNF) 2013 International Conference on Noise and Fluctuations (ICNF), Jun 2013, Montpellier, France. ⟨10.1109/ICNF.2013.6578996⟩ |
| DOI: | 10.1109/ICNF.2013.6578996⟩ |
| Popis: | Evaluating the performances of infrared photodetectors requires both electrical and optical measurements, including a detailed analysis of the noise behavior. Indeed, in such detectors, noise can arise from the absorbing layer (Schottky noise due to photonic and dark currents, thermal noise, low frequency noise due to technological imperfections) as well as from the read-out integrated circuit (ROIC) or from the analog to digital converter (ADC). Therefore, it is of great importance to carry out noise measurements on single elements (without ROIC and ADC) as well as on focal plane arrays. In this paper, we present noise measurements on single detectors and on a large format focal plane array, both suitable to address the 3-5μm spectral range. The single detectors are InAs/GaSb superlattice pin photodiodes which already proved to be a very promising emerging technology, whereas the focal plane array relies on the well established, high performance InSb technology. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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