Combining two structural techniques on the micrometer scale: micro-XAS and micro-Raman spectroscopy
| Autor: | P. Lagarde, Delphine Vantelon, B. Couzinet, Anne-Marie Flank, F. Villain, Valérie Briois |
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| Rok vydání: | 2007 |
| Předmět: |
Nuclear and High Energy Physics
X-ray absorption spectroscopy Radiation Materials science Micrometer scale business.industry Photothermal microspectroscopy Instrumental chemistry Polarization (waves) Micro raman spectroscopy symbols.namesake Beamline symbols Optoelectronics business Raman spectroscopy Instrumentation |
| Zdroj: | Journal of Synchrotron Radiation. 14:403-408 |
| ISSN: | 0909-0495 |
| DOI: | 10.1107/s0909049507028683 |
| Popis: | X-ray absorption and Raman spectroscopies are complementary in the sense that both give very precise information about the local structure of a sample, both are not restricted to crystalline materials, and in both cases the volumes of the material probed are similar. The X-ray technique has the advantage of being element- and orbital-selective, and sensitive to orientational effects owing to polarization selection rules. In many cases, however, its analysis can present some ambiguity. Combining the two techniques on a micrometer scale could therefore be a very powerful method structurally. In this paper the experimental set-up developed at the LUCIA beamline and its application to a natural mineral are described. |
| Databáze: | OpenAIRE |
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