Preparation and Thermal Characterization of Annealed Gold Coated Porous Silicon
| Autor: | Wan Mahmood Mat Yunus, Afarin Bahrami, Zainal Abidin Talib, Kasra Behzad, Azmi Zakaria |
|---|---|
| Rok vydání: | 2012 |
| Předmět: |
Materials science
Scanning electron microscope Annealing (metallurgy) thermal diffusivity Analytical chemistry aging effect Porous silicon Thermal diffusivity lcsh:Technology Article Condensed Matter::Materials Science General Materials Science Wafer lcsh:Microscopy Photoacoustic spectroscopy lcsh:QC120-168.85 photoacoustic spectroscopy lcsh:QH201-278.5 lcsh:T Anodizing porous silicon gold annealing lcsh:TA1-2040 lcsh:Descriptive and experimental mechanics lcsh:Electrical engineering. Electronics. Nuclear engineering lcsh:Engineering (General). Civil engineering (General) lcsh:TK1-9971 Current density |
| Zdroj: | Materials; Volume 5; Issue 1; Pages: 157-168 Materials Materials, Vol 5, Iss 1, Pp 157-168 (2012) |
| ISSN: | 1996-1944 |
| DOI: | 10.3390/ma5010157 |
| Popis: | Porous silicon (PSi) layers were formed on a p-type Si wafer. Six samples were anodised electrically with a 30 mA/cm 2 fixed current density for different etching times. The samples were coated with a 50-60 nm gold layer and annealed at different temperatures under Ar flow. The morphology of the layers, before and after annealing, formed by this method was investigated by scanning electron microscopy (SEM). Photoacoustic spectroscopy (PAS) measurements were carried out to measure the thermal diffusivity (TD) of the PSi and Au/PSi samples. For the Au/PSi samples, the thermal diffusivity was measured before and after annealing to study the effect of annealing. Also to study the aging effect, a comparison was made between freshly annealed samples and samples 30 days after annealing. |
| Databáze: | OpenAIRE |
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