Using resistivity or logarithm of resistivity to calculate Depth of Investigation index to assess reliability of Electrical Resistivity Tomography
| Autor: | Simon Damien Carrière, Laura Torres-Rondon, Charles Danquigny, Konstantinos Chalikakis |
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| Přispěvatelé: | Environnement Méditerranéen et Modélisation des Agro-Hydrosystèmes (EMMAH), Avignon Université (AU)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE), Instituto de Ciencias de la Terra [Caracas] (ICT), Universidad Central de Venezuela (UCV) |
| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: |
Index (economics)
Materials science 010504 meteorology & atmospheric sciences Logarithm profondeur [SDV]Life Sciences [q-bio] Soil science tomography 010502 geochemistry & geophysics 01 natural sciences Auger profoundness High resistivity étude comparative Geochemistry and Petrology Electrical resistivity and conductivity Statistics logarithme Electrical resistivity tomography Electrical conductor Reliability (statistics) comparative study 0105 earth and related environmental sciences résistivité tomographie resistivity Geophysics |
| Zdroj: | Geophysics Geophysics, Society of Exploration Geophysicists, 2017, 82 (5), pp.1-21. ⟨10.1190/geo2016-0244.1⟩ Geophysics, Society of Exploration Geophysicists, 2017, pp.1-21. ⟨10.1190/geo2016-0244.1⟩ |
| ISSN: | 0016-8033 |
| DOI: | 10.1190/geo2016-0244.1⟩ |
| Popis: | We have conducted a comparative study to determine the most efficient and reliable way to calculate the depth of investigation (DOI) index to assess the quality of electrical resistivity tomography models. We compared the results of using resistivity and logarithm of resistivity after testing them on four synthetic models by direct modeling and a field case, in which the resistivity model was validated by auger drillings. We tested the two most commonly used acquisition arrays, dipole-dipole, and Wenner-Schlumberger. The index calculated with the logarithm of resistivity clearly appears to be more satisfactory than the resistivity-based index. The method based on resistivity systematically overestimates risk (high DOI) in areas of high resistivity, and it underestimates risk in conductive zones. As a result, we strongly recommend the use of the logarithm of inverted resistivity to calculate the DOI index. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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