Pseudo-Brewster and second-Brewster angles of an absorbing substrate coated by a transparent thin film
| Autor: | Tracy F. Thonn, R. M. A. Azzam |
|---|---|
| Rok vydání: | 1983 |
| Předmět: |
Brewster's angle
Materials science business.industry Materials Science (miscellaneous) Optical polarization Polarizer Polarization (waves) Industrial and Manufacturing Engineering law.invention Wavelength Film coating symbols.namesake Optics Optical coating law symbols Business and International Management Thin film business |
| Zdroj: | Applied optics. 22(24) |
| ISSN: | 1559-128X |
| Popis: | The pseudo-Brewster angle of minimum reflectance for the p polarization, the corresponding angle for the s polarization, and the second-Brewster angle of minimum ratio of the p and s reflectances are all determined as functions of the thickness of a transparent film coating an absorbing substrate by numerical solution of the exact equations that govern such angles of the form Re(Z′/Z) = 0, where Z = Rp, Rs, or ρ represent the complex amplitude-reflection coefficients for the p and s polarizations and their ratio (ρ = Rp/Rs), respectively, and Z′ is the angle-of-incidence derivative of Z. Results that show these angles and their associated reflectance and reflectance-ratio minima are presented for the SiO2–Si film–substrate system at wavelength λ = 0.6328 μm and film thickness of up to four periods (≃1.2 μm). Applications of these results are proposed in film-thickness measurement and control. |
| Databáze: | OpenAIRE |
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