Growth and characterization of ultrathin carbon films on electrodeposited Cu and Ni
| Autor: | Andrea Lucotti, Luca Magagnin, P. Soltani, Saulius Kaciulis, Roberto Bernasconi, Alessio Mezzi, Luca Giampaolo Nobili, Lorenzo Pedrazzetti |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: |
Materials Chemistry2506 Metals and Alloys
Auger spectroscopy graphene metal electrodeposition Raman spectroscopy UPS XPS Chemistry (all) Condensed Matter Physics Surfaces and Interfaces Surfaces Coatings and Films Materials science Photoemission spectroscopy Analytical chemistry chemistry.chemical_element 02 engineering and technology 010402 general chemistry 01 natural sciences law.invention Coatings and Films symbols.namesake X-ray photoelectron spectroscopy law Materials Chemistry Graphite Auger electron spectroscopy Graphene General Chemistry 021001 nanoscience & nanotechnology 0104 chemical sciences Surfaces Carbon film chemistry symbols 0210 nano-technology Carbon |
| Zdroj: | SIA. Surface and interface analysis 49 (2017): 1088–1094. doi:10.1002/sia.6281 info:cnr-pdr/source/autori:Pedrazzetti, L.; Nobili, L.; Magagnin, L.; Bernasconi, R.; Lucotti, A.; Soltani, P.; Mezzi, A.; Kaciulis, S./titolo:Growth and characterization of ultrathin carbon films on electrodeposited Cu and Ni/doi:10.1002%2Fsia.6281/rivista:SIA. Surface and interface analysis/anno:2017/pagina_da:1088/pagina_a:1094/intervallo_pagine:1088–1094/volume:49 |
| DOI: | 10.1002/sia.6281 |
| Popis: | Ultrathin carbon films were grown on different types of metallic substrates. Free-standing foils of Cu and Ni were prepared by electroforming, and a pure Ni film was obtained by galvanic displacement on a Si wafer. Commercial foil of Ni 99.95% was used as a reference substrate. Carbon films were grown on these substrates by chemical vapour deposition in a CH4-H2 atmosphere. Obtained films were characterized by Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy, and ultraviolet photoemission spectroscopy. The XPS at grazing collection angle was used to determine the thickness of carbon films. Depending on the deposition parameters, the films of graphene or graphite were obtained on the different substrates. The uniformity of graphene and its distribution over the sample area were investigated from Raman data, optical images, and XPS chemical maps. The presence of graphene or graphite in the films was determined from the Raman spectra and Auger peak of C KVV. For this purpose, the D parameter, which is a fingerprint of carbon allotropes, was determined from C KVV spectra acquired by using X-rays and electron beam. A formation of an intermediate layer of metal hydroxide was revealed in the samples with graphene overlayer. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|