Cylindrical Films for Electronics in Low Background Physics Searches
Autor: | M. Giordano, Ethan Brown, J. Freedberg, K. Odgers, Kim M. Lewis, T. Berger |
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Jazyk: | angličtina |
Rok vydání: | 2019 |
Předmět: |
Physics
Physics - Instrumentation and Detectors Condensed matter physics 010308 nuclear & particles physics FOS: Physical sciences Instrumentation and Detectors (physics.ins-det) Substrate (electronics) 01 natural sciences Electron beam physical vapor deposition 030218 nuclear medicine & medical imaging law.invention Azimuth 03 medical and health sciences 0302 clinical medicine Van der Pauw method Planar law Electrical resistivity and conductivity 0103 physical sciences Resistor Anisotropy Instrumentation Mathematical Physics |
Popis: | A technique for manufacturing thin-film resistors on cylindrical substrates is demonstrated. These devices are aimed for application in rare-event detectors that must minimize radioactive backgrounds from trace impurities in electronic components inside the detector. Cylindrical, conducting Ni films were created via Electron Beam Deposition, using a mechanism that rotates the substrate, to demonstrate proof of principle and measure the resistivity on axis and in azimuth. These films are characterized by measurements using a facsimile of the Van Der Pauw method combined with electrostatic simulations. In the two cylindrical samples made we observe anisotropic electrical behavior with resistivities of 1392.5, 888.5 $n \Omega m$ around the azimuth and of 81.9, 72.8 $n \Omega m$ along the axis of the sample. We show that this anisotropy is not caused just by the electron beam evaporation by measuring a planar rectangle sample made in the same process but without spinning which has estimated resistivities of 66.5, and 71.9 $n \Omega m$ in both directions, and calculated resistivity using the standard Van der Pauw equation of $66.1\pm2.8$ $n \Omega m$. In spite of the anisotropy in the cylindrical samples, we show that these films can be used as resistors. |
Databáze: | OpenAIRE |
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