Ballistic-electron-emission microscopy of electron transport through AlAs/GaAs heterostructures
| Autor: | Liu Jk, L. C. Davis, Frank J. Grunthaner, L. D. Bell, Michael H. Hecht, William J. Kaiser |
|---|---|
| Rok vydání: | 1993 |
| Předmět: |
Electron transmission
Quantitative Biology::Biomolecules Condensed Matter::Materials Science Formalism (philosophy of mathematics) Tight binding Materials science Condensed matter physics Electrical resistivity and conductivity Heterojunction Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Spectroscopy Electron transport chain Ballistic electron emission microscopy |
| Zdroj: | Physical Review B. 48:18324-18327 |
| ISSN: | 1095-3795 0163-1829 |
| DOI: | 10.1103/physrevb.48.18324 |
| Popis: | BEEM spectroscopy has been used to characterize hot-carrier transport through AlAs/GaAs heterostructures. The dependence of electron transmission on AlAs thickness has been directly measured, and the position of the AlAs L 1 minima, which has been subject to some uncertainty in the past, has been determined. First-principles transmission calculations, based on a tight-binding formalism, are compared to the results of BEEM spectroscopy |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|