Anisotropy in thin films: modeling and measurement of guided and nonguided optical properties: application to TiO(2) films
| Autor: | Dominique Endelema, Ian J. Hodgkinson, Francois Flory, Emile Pelletier |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Electromagnetic field
Materials science business.industry Materials Science (miscellaneous) Dielectric Transfer matrix Industrial and Manufacturing Engineering Condensed Matter::Soft Condensed Matter Condensed Matter::Materials Science Optical coating Optics Reflection (mathematics) Business and International Management Thin film business Anisotropy Refractive index |
| Zdroj: | Applied optics. 32(28) |
| ISSN: | 1559-128X |
| Popis: | The main purpose of this research is to study the anisotropic behavior of dielectric material in thin-film form. First we present a theory based on a 4 × 4 transfer matrix linking tangential components of the electromagnetic field on one interface to the tangential components of the electromagnetic field on the other interface of an anisotropic thin film. A biaxial model is associated with the columnar structure of the layer. The comparison between measurements of the transmission in normal incidence in cross-polarized light and of guided-mode propagation constants with the calculations allows us to study the biaxial behavior of TiO(2) films. The excellent consistency between measurements and computations demonstrates the validity of the model based on the columnar structure. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|