Spectral measurement using IC-compatible linear variable optical filter
| Autor: | S. Grabarnik, Arvin Emadi, H. Wu, Peter Enoksson, Karin Hedsten, Ger de Graaf, Reinoud F. Wolffenbuttel, José Higino Correia |
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| Rok vydání: | 2010 |
| Předmět: |
Neon lamp
Materials science Spectrometer business.industry Detector 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Collimated light law.invention tapered Fabry-Perot 010309 optics Wavelength Optics Resist CMOS-compatible optical sensors law microspectrometer 0103 physical sciences 0210 nano-technology Optical filter business Lithography linear variable filter |
| Zdroj: | Proceedings of SPIE, 2010, vol. 7716 |
| ISSN: | 0277-786X |
| DOI: | 10.1117/12.854548 |
| Popis: | This paper reports on the functional and spectral characterization of a microspectrometer based on a CMOS detector array covered by an IC-Compatible Linear Variable Optical Filter (LVOF). The Fabry-Perot LVOF is composed of 15 dielectric layers with a tapered middle cavity layer, which has been fabricated in an IC-Compatible process using resist reflow. A pattern of trenches is made in a resist layer by lithography and followed by a reflow step result in a smooth tapered resist layer. The lithography mask with the required pattern is designed by a simple geometrical model and FEM simulation of reflow process. The topography of the tapered resist layer is transferred into silicon dioxide layer by an optimized RIE process. The IC-compatible fabrication technique of such a LVOF, makes fabrication directly on a CMOS or CCD detector possible and would allow for high volume production of chip-size micro-spectrometers. The LVOF is designed to cover the 580 nm to 720 spectral range. The dimensions of the fabricated LVOF are 5×5 mm2. The LVOF is placed in front of detector chip of a commercial camera to enable characterization. An initial calibration is performed by projecting monochromatic light in the wavelength range of 580 nm to 720 nm on the LVOF and the camera. The wavelength of the monochromatic light is swept in 1 nm steps. The Illuminated stripe region on the camera detector moves as the wavelength is swept. Afterwards, a Neon lamp is used to validate the possibility of spectral measurement. The light from a Neon lamp is collimated and projected on the LVOF on the camera chip. After data acquisition a special algorithm is used to extract the spectrum of the Neon lamp. |
| Databáze: | OpenAIRE |
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