Robustness analysis of multiprocessor schedules
Autor: | Adyanthaya, S., Zhang, Z., Geilen, M.C.W., Voeten, J.P.M., Basten, T., Schiffelers, R.R.H., Galuzzi, C., Veidenbaum, A. |
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Přispěvatelé: | Electronic Systems, Software Engineering and Technology, CompSOC Lab- Predictable & Composable Embedded Systems |
Jazyk: | angličtina |
Rok vydání: | 2014 |
Předmět: |
Communication & Information
TS - Technical Sciences Industrial Innovation Computer science Multiprocessing Parallel computing ESI - Embedded Systems Innovation Directed acyclic graph Computer engineering General purpose Robustness (computer science) Curve fitting Probabilistic robustness Completion time Electronics Robustness analysis Simulation based Computer Science::Operating Systems |
Zdroj: | Proceedings 2014 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS XIV), July 14-17, 2014, Samos, Greece, 9-17 STARTPAGE=9;ENDPAGE=17;TITLE=Proceedings 2014 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS XIV), July 14-17, 2014, Samos, Greece Veidenbaum A.V.Galuzzi C., 14th International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation, SAMOS 2014, 14 July 2014 through 17 July 2014, 9-17 ICSAMOS |
Popis: | Tasks executing on general purpose multiprocessor platforms exhibit variations in their execution times. As such, there is a need to explicitly consider robustness, i.e., tolerance to these fluctuations. This work aims to quantify the robustness of schedules of directed acyclic graphs (DAGs) on multiprocessors by defining probabilistic robustness metrics and to present a new approach to perform robustness analysis to obtain these metrics. Stochastic execution times of tasks are used to compute completion time distributions which are then used to compute the metrics. To overcome the difficulties involved with the max operation on distributions, a new curve fitting approach is presented using which we can derive a distribution from a combination of analytical and limited simulation based results. The approach has been validated on schedules of time-critical applications in ASML wafer scanners. |
Databáze: | OpenAIRE |
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