Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution

Autor:	C. H. Wang, Wenbing Yun, Yong S. Chu, Chian Liu, Chung-Shi Yang, M. Feser, Y. Hwu, A. Tkachuk, Syue-Ren Wu, Qiang Shen, Chia-Chi Chien, Junyue Wang, Giorgio Margaritondo, Cheng-Liang Wang, F. De Carlo, H. J. Wu, Wah-Keat Lee, Jung Ho Je, Jae-mock Yi, Keng S. Liang
Přispěvatelé:	Chu, Y S, Yi, J, De, Carlo F, Shen, Q, Lee, Wookyung, Wu, H, Wang, X, Wang, J, Liu, Chengfei, Wang, Chun, Wu, Yong, Chien, Chia-Chi, Hwu, Y, Tkachuk, A, Yun, W, Feser, M, Liang, Wen-Kuei, Yang, C
Rok vydání:	2008
Předmět:	Diffraction Physics Fresnel zone Physics and Astronomy (miscellaneous) business.industry Resolution (electron density) Fresnel lens law.invention symbols.namesake Nanolithography Optics law Microscopy symbols Rayleigh scattering business Fresnel diffraction
Zdroj:	Applied Physics Letters. 92:103119
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.2857476
Popis:	Substantial improvements in the nanofabrication and characteristics of gold Fresnel zone plates yielded unprecedented resolution levels in hard-x-ray microscopy. Tests performed on a variety of specimens with 8-10keV photons demonstrated a first-order lateral resolution below 40nm based on the Rayleigh criterion. Combined with the use of a phase contrast technique, this makes it possible to view features in the 30nm range; good-quality images can be obtained at video rate, down to 50ms/frame. The important repercussions on materials science, nanotechnology, and the life sciences are discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76b072019379c4029007a63b95a05c4d https://doi.org/10.1063/1.2857476 Zobrazit plný text záznamu