Comparison Between A Posteriori Error Indicators For Adaptive Mesh Generation In Semiconductor Device Simulation

Autor:	K. Tanaka, P. Ciampohni, G. Baccarani, A. Pierantoni
Rok vydání:	2005
Předmět:	Very-large-scale integration business.industry Mesh generation Computer science National Electrical Code Electrical engineering Electronic engineering Microelectronics A priori and a posteriori Semiconductor device business Current density Piecewise linear approximation
Zdroj:	Scopus-Elsevier
DOI:	10.1109/vpad.1993.724748
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::738e1d0d5a26a527c39a092be0687c7a https://doi.org/10.1109/vpad.1993.724748 Zobrazit plný text záznamu