Attractive method for thickness-independent permittivity measurements of solid dielectric materials
| Autor: | Ugur Cem Hasar, Musa Bute, Yunus Kaya, Mustafa Engin Kocadagistan, Mehmet Ertugrul, Joaquim J. Barroso |
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| Přispěvatelé: | Bayburt University |
| Rok vydání: | 2014 |
| Předmět: |
Permittivity
Branch-index value Materials science Sample (material) Relative permittivity Dielectric Thickness-independent Separation Solid materials Dielectric materials Optics Branch index Electrical and Electronic Engineering Invariant (mathematics) Instrumentation Uncertainty analysis business.industry Permittivity measurement Metals and Alloys Function (mathematics) Condensed Matter Physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Computational physics Reference-plane invariant Transformation (function) Sample thickness business Solid material |
| Zdroj: | Sensors and Actuators A: Physical. 206:107-120 |
| ISSN: | 0924-4247 |
| DOI: | 10.1016/j.sna.2013.11.032 |
| Popis: | We propose a non-resonant-type method for reference-plane invariant and thickness-independent permittivity measurement of solid dielectric materials when there is no information from permittivity. To achieve this, we derive a branch-index-independent function and verify that it determines the sample thickness and permittivity without resorting to finding the correct branch index value for three different measurement scenarios: (a) measurements at closely separated frequencies of non-dispersive samples, (b) measurements at largely separated frequencies of non-dispersive samples, and (c) measurements at largely separated frequencies of dispersive samples. Via a differential uncertainty analysis, the effect of inaccurate sample thickness on permittivity determination is also presented for demonstration of the improvement achieved by our method. For validation, we measured the permittivity of an approximately 20 mm PTFE sample using the presented method and compared its result with those from other similar methods. From the comparison, we note that the accuracy of tested methods from literature drastically decreases when accurate information of sample thickness is not known (in addition to a further decrease in accuracy when correct transformation factors from reference-planes are not known a priori), while the accuracy of our method is not influenced. © 2013 Elsevier B.V. |
| Databáze: | OpenAIRE |
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