VLSI reliability in Europe
| Autor: | Verweij, J.F., Verweij, Jan F. |
|---|---|
| Rok vydání: | 1993 |
| Předmět: |
Very-large-scale integration
Engineering Electrostatic discharge Standardization business.industry Electric breakdown Temperature cycling Circuit reliability Reliability engineering METIS-112036 IR-15162 Interest group Hardware_INTEGRATEDCIRCUITS Electrical and Electronic Engineering business Information exchange |
| Zdroj: | Proceedings of the IEEE, 81(5), 675-681. IEEE |
| ISSN: | 0018-9219 |
| DOI: | 10.1109/5.220899 |
| Popis: | Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described. Within one such program, ESPRIT, a technical interest group on IC reliability was formed to formulate particular needs and necessary improvements in education and research. In addition to ESPRIT research projects, there are smaller projects on reliability subjects. Two examples, one dealing with plastic-encapsulation and the other with electrostatic discharge, are treated in some detail. Some achievements in the areas of oxide breakdown and plastic encapsulated ICs in temperature cycling are also presented. A few opinions are offered on trends in reliability engineering, including reliability circuit simulation. > |
| Databáze: | OpenAIRE |
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