A versatile diamond anvil cell for X-ray inelastic, diffraction and imaging studies at synchrotron facilities
| Autor: | Jeroen Jacobs, Leonid Dubrovinsky, Rémi Tucoulou, Valerio Cerantola, Christoph J. Sahle, Ines E. Collings, Sylvain Petitgirard |
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| Přispěvatelé: | Petitgirard, S, Jacobs, J, Cerantola, V, Collings, I, Tucoulou, R, Dubrovinsky, L, Sahle, C |
| Rok vydání: | 2019 |
| Předmět: |
Diffraction
Materials science engineering.material 01 natural sciences Diamond anvil cell 010305 fluids & plasmas law.invention symbols.namesake law XRS 0103 physical sciences synchrotron Instrumentation 010302 applied physics Brillouin Spectroscopy business.industry Diamond imaging Synchrotron diamond anvil cell X-ray crystallography engineering symbols Optoelectronics business Raman spectroscopy Powder diffraction IXS |
| Zdroj: | The Review of scientific instruments. 90(9) |
| ISSN: | 1089-7623 |
| Popis: | We present a new diamond anvil cell design, hereafter called mBX110, that combines both the advantages of a membrane and screws to generate high pressure. It enables studies at large-scale facilities for many synchrotron X-ray techniques and has the possibility to remotely control the pressure with the membrane as well as the use of the screws in the laboratory. It is fully compatible with various gas-loading systems as well as high/low temperature environments in the lab or at large scale facilities. The mBX110 possesses an opening angle of 85° suitable for single-crystal diffraction or Brillouin spectroscopy and a large side opening of 110° which can be used for X-ray inelastic techniques, such as X-ray Raman scattering spectroscopy, but also for X-ray emission, X-ray fluorescence, or X-ray absorption. An even larger opening of 150° can be manufactured enabling X-ray imaging tomography. We report data obtained with the mBX110 on different beamlines with single-crystal diffraction of stishovite up to 55 GPa, X-ray powder diffraction of rutile-GeO2 and tungsten to 25 GPa and 280 GPa, respectively, X-Ray Raman spectra of the Si L-edge in silica to 95 GPa, and Fe Kβ X-ray emission spectra on a basalt glass to 17 GPa. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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