Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope

Autor:	Thomas Riedel, Heiko Müller, Stephan Uhlemann, Peter Hartel, Martin Linck, Volker Gerheim
Rok vydání:	2020
Předmět:	Materials science Optics Transmission electron microscopy business.industry business Instrumentation
Zdroj:	Microscopy and Microanalysis
ISSN:	1435-8115 1431-9276
Popis:	Aberration correctors using hexapole fields have proven useful to correct for the spherical aberration in electron microscopy. We investigate the limits of the present design for the hexapole corrector with respect to minimum probe size for the scanning transmission electron microscope and discuss several ways in which the design could be improved by rather small and incremental design changes for the next generation of advanced probe-forming systems equipped with a gun monochromator.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64558e40dba0e16396f7befdaf414a32 https://doi.org/10.1017/s1431927620020619 Zobrazit plný text záznamu