A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits
| Autor: | Stanisław Hałgas, Michał Tadeusiewicz |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Analogue electronics
020208 electrical & electronic engineering Diagnostic test 02 engineering and technology Fault (power engineering) 020202 computer hardware & architecture Nonlinear programming 0202 electrical engineering electronic engineering information engineering Electronic engineering Sensitivity (control systems) Electrical and Electronic Engineering Mathematics Voltage Electronic circuit |
| Zdroj: | Journal of Electronic Testing. 33:147-156 |
| ISSN: | 1573-0727 0923-8174 |
| DOI: | 10.1007/s10836-017-5650-4 |
| Popis: | The paper deals with multiple soft fault diagnosis of linear analog circuits. The basic problem of arranging diagnostic tests performed in DC or AC states is considered in detail. A systematic method is developed that allows finding values of the sources applied to the excitation nodes as well as the measurement nodes at which the voltage variations due to the parameter deviations are sufficiently large. For this purpose the sensitivity analysis and the nonlinear programming technique, with appropriate objective function and constraints, are used. Four numerical examples reveal effectiveness of the proposed method for arranging the diagnostic tests. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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