Microwave device characterisation using a widefield diamond microscope

Autor: Andrew Horsley, Jocelyn Achard, Patrick Appel, Janik Wolters, Patrick Maletinsky, Philipp Treutlein, Alexandre Tallaire
Přispěvatelé: Department of Physics, University of Basel, Laboratoire des Sciences des Procédés et des Matériaux (LSPM), Université Paris 13 (UP13)-Institut Galilée-Université Sorbonne Paris Cité (USPC)-Centre National de la Recherche Scientifique (CNRS), Institut de Recherche de Chimie Paris (IRCP), Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Ecole Nationale Supérieure de Chimie de Paris - Chimie ParisTech-PSL (ENSCP), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Ministère de la Culture (MC), Quantum atom optics lab, University of Basel (Unibas)
Jazyk: angličtina
Rok vydání: 2018
Předmět:
Zdroj: Physical Review Applied
Physical Review Applied, American Physical Society, 2018, 10 (4), ⟨10.1103/PhysRevApplied.10.044039⟩
ISSN: 2331-7019
Popis: Devices relying on microwave circuitry form a cornerstone of many classical and emerging quantum technologies. A capability to provide in-situ, noninvasive and direct imaging of the microwave fields above such devices would be a powerful tool for their function and failure analysis. In this work, we build on recent achievements in magnetometry using ensembles of nitrogen vacancy centres in diamond, to present a widefield microwave microscope with few-micron resolution over a millimeter-scale field of view, 130nT/sqrt-Hz microwave amplitude sensitivity, a dynamic range of 48 dB, and sub-ms temporal resolution. We use our microscope to image the microwave field a few microns above a range of microwave circuitry components, and to characterise a novel atom chip design. Our results open the way to high-throughput characterisation and debugging of complex, multi-component microwave devices, including real-time exploration of device operation.
Databáze: OpenAIRE