Microwave device characterisation using a widefield diamond microscope
| Autor: | Andrew Horsley, Jocelyn Achard, Patrick Appel, Janik Wolters, Patrick Maletinsky, Philipp Treutlein, Alexandre Tallaire |
|---|---|
| Přispěvatelé: | Department of Physics, University of Basel, Laboratoire des Sciences des Procédés et des Matériaux (LSPM), Université Paris 13 (UP13)-Institut Galilée-Université Sorbonne Paris Cité (USPC)-Centre National de la Recherche Scientifique (CNRS), Institut de Recherche de Chimie Paris (IRCP), Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Ecole Nationale Supérieure de Chimie de Paris - Chimie ParisTech-PSL (ENSCP), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Ministère de la Culture (MC), Quantum atom optics lab, University of Basel (Unibas) |
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
Microscope
FOS: Physical sciences General Physics and Astronomy Applied Physics (physics.app-ph) 02 engineering and technology Astrophysics::Cosmology and Extragalactic Astrophysics engineering.material 01 natural sciences Imaging phantom law.invention Optics [PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph] law Mesoscale and Nanoscale Physics (cond-mat.mes-hall) 0103 physical sciences 010306 general physics ComputingMilieux_MISCELLANEOUS Physics [PHYS]Physics [physics] Quantum Physics Condensed Matter - Mesoscale and Nanoscale Physics business.industry Image (category theory) Diamond Physics - Applied Physics 021001 nanoscience & nanotechnology Characterization (materials science) Quantum technology engineering Quantum Physics (quant-ph) 0210 nano-technology business Microwave |
| Zdroj: | Physical Review Applied Physical Review Applied, American Physical Society, 2018, 10 (4), ⟨10.1103/PhysRevApplied.10.044039⟩ |
| ISSN: | 2331-7019 |
| Popis: | Devices relying on microwave circuitry form a cornerstone of many classical and emerging quantum technologies. A capability to provide in-situ, noninvasive and direct imaging of the microwave fields above such devices would be a powerful tool for their function and failure analysis. In this work, we build on recent achievements in magnetometry using ensembles of nitrogen vacancy centres in diamond, to present a widefield microwave microscope with few-micron resolution over a millimeter-scale field of view, 130nT/sqrt-Hz microwave amplitude sensitivity, a dynamic range of 48 dB, and sub-ms temporal resolution. We use our microscope to image the microwave field a few microns above a range of microwave circuitry components, and to characterise a novel atom chip design. Our results open the way to high-throughput characterisation and debugging of complex, multi-component microwave devices, including real-time exploration of device operation. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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