High refractive index properties of oxyfluorosilicate glasses and a unified dielectric model of silicate oxide glasses in the sub-terahertz frequency region
| Autor: | Osamu Wada, D. Ramachari, Ci-Ling Pan, Takashi Uchino, Chan-Shan Yang |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Materials science
business.industry High-refractive-index polymer Terahertz radiation Oxide Physics::Optics 02 engineering and technology Dielectric 021001 nanoscience & nanotechnology Condensed Matter::Disordered Systems and Neural Networks 01 natural sciences Silicate Electronic Optical and Magnetic Materials Condensed Matter::Soft Condensed Matter 010309 optics chemistry.chemical_compound chemistry Polarizability 0103 physical sciences Optoelectronics 0210 nano-technology business Spectroscopy Refractive index |
| Zdroj: | Optical Materials Express. 10(2):607-621 |
| ISSN: | 2159-3930 |
| Popis: | Dielectric properties of oxyfluorosilicate (OFS) glasses have been characterized using Terahertz (THz)-time domain spectroscopy in the sub-THz region as well as optical reflection measurement. OFS glass containing 20 mol% of Nb2O5, which is termed ZNbKLSNd glass, has the highest refractive index of 3.70 in the sub-THz region. The THz and optical refractive indices of various silicate oxide glasses, including OFS glasses, have been confirmed to be correlated by a unified relationship utilizing a parameter defined by the ratio of ionic to electronic polarizability. Additionally, the frequency dependence of the THz dielectric constant has been interpreted by a single oscillator model for all silicate oxide glasses including OFS glasses. On the basis of the present unified dielectric model, the very high refractive index of ZNbKLSNd glass has been attributed to the lowering of oscillator resonance wavelength originated from the incorporation of Nb2O5 intermediate network former. |
| Databáze: | OpenAIRE |
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