Measurement of synchrotron pulse durations using surface photovoltage transients
| Autor: | Thornton E. Glover, Robert W. Schoenlein, Ali Belkacem, Philip Heimann, W.F. Steele, Howard A. Padmore, G.D. Ackermann, B. Feinberg, Cédric Ray, Zahid Hussain |
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| Rok vydání: | 2001 |
| Předmět: |
Physics
Nuclear and High Energy Physics Picosecond laser business.industry Astrophysics::High Energy Astrophysical Phenomena Surface photovoltage Synchrotron radiation Laser Synchrotron Direct measure law.invention Pulse (physics) advanced light source als Optics law Materials Sciences Physics::Accelerator Physics business Instrumentation |
| Zdroj: | Glover, T.E.; Ackermann, G.D.; Belkacem, A.; Feinberg, B.; Heimann, P.A.; Hussain, Z.; et al.(2001). Measurement of synchrotron pulse durations using surface photovoltage transients. Lawrence Berkeley National Laboratory. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/2s28z6jv |
| ISSN: | 0168-9002 |
| Popis: | We report results on experiments using combined laser and synchrotron radiation. Picosecond laser pulses at 800 nm are used to induce surface photovoltage transients in p-type Si samples. A two-component decay is observed. The fast component of decay provides a direct measure of synchrotron soft X-ray pulse durations. |
| Databáze: | OpenAIRE |
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