Laboratory high-pressure single-crystal x-ray diffraction—recent improvements and examples of studies
| Autor: | J. Gaultier, S Pechev, Daniel Chasseau, Y. Barrans, M Marchivie, Philippe Guionneau, D. Le Pevelen |
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| Přispěvatelé: | Institut de Chimie de la Matière Condensée de Bordeaux (ICMCB), Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université de Bordeaux (UB) |
| Jazyk: | angličtina |
| Rok vydání: | 2004 |
| Předmět: |
Diffraction
X-ray diffractometry Chemistry business.industry 02 engineering and technology [CHIM.MATE]Chemical Sciences/Material chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences 0104 chemical sciences 3. Good health X-ray diffraction High pressure Optics X-ray crystallography General Materials Science Ccd detector 0210 nano-technology business Single crystal |
| Zdroj: | Journal of Physics: Condensed Matter Journal of Physics: Condensed Matter, IOP Publishing, 2004, 16 (14), pp.S1151-S1159. ⟨10.1088/0953-8984/16/14/025⟩ |
| ISSN: | 0953-8984 1361-648X |
| Popis: | Some recent improvements made to the high-pressure single-crystal x-ray diffraction (XRD) experiments in use in our laboratory are reviewed. In particular a set-up to perform high-pressure (0–3.0 GPa)–low-temperature (300–9 K) investigations as well as a protocol for high-pressure XRD data collection using a CCD detector are shown. Examples of studies are also presented. |
| Databáze: | OpenAIRE |
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