Automated optical monitoring wavelength selection for thin-film filters

Autor: Julien Lumeau, Janis Zideluns, Detlef Arhilger, Harro Hagedorn, Fabien Lemarchand
Přispěvatelé: RCMO (RCMO), Institut FRESNEL (FRESNEL), Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Marseille (ECM)-Aix Marseille Université (AMU), Buhler AG, Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)-École Centrale de Marseille (ECM)-Centre National de la Recherche Scientifique (CNRS)
Jazyk: angličtina
Rok vydání: 2021
Předmět:
Zdroj: Optics Express
Optics Express, Optical Society of America-OSA Publishing, 2021, 29 (21), pp.33398-331413. ⟨10.1364/OE.439033⟩
Optics Express, 2021, 29 (21), pp.33398-331413. ⟨10.1364/OE.439033⟩
ISSN: 1094-4087
DOI: 10.1364/OE.439033⟩
Popis: International audience; In this paper we study the wavelength selection process for optical monitoring of thin film filters. We first discuss the technical limitations of monitoring systems as well as the criteria defining the sensitivity of different wavelengths to thickness errors. We then present an approach that considers the best monitoring wavelength for each individual layer with a monitoring strategy selection process that can be fully automated. We finally validate experimentally the proposed approach on several optical filters of increasing complexity. Optical interference filters with close to theoretical performances are demonstrated.
Databáze: OpenAIRE