| Autor: |
Adamo, Giorgio, Aik Chan, Eng, Li, Jinxiang, Liu, Tongjun, Kurdiumov, Sergei, MacDonald, Kevin F., Ou, Jun-Yu, Papasimakis, Nikitas, Plum, Eric, Pu, Tanchao, Rendon-Barraza, Carolina, Wang, Yu, Zheludev, Nikolai |
| Rok vydání: |
2022 |
| Zdroj: |
Metamaterials XIII. |
| Popis: |
The resolution of conventional microscopy is limited to a half of the wavelength of light. We report on recent advances in applications of deep learning and topologically structured light to far-field nondestructive imaging with deep subwavelength resolution and to picometric metrology. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
