Scanning ion-conductance microscopy technique for studying the topography and mechanical properties of Candida parapsilosis yeast microorganisms
| Autor: | Nikita Savin, Alexander Erofeev, Vasilii Kolmogorov, Sergey Salikhov, Yuri Efremov, Peter Timashev, Natalia Grammatikova, Igor Levshin, Christopher Edwards, Yuri Korchev, Petr Gorelkin |
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| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Biomaterials science. |
| ISSN: | 2047-4849 |
| Popis: | Super-resolution microscopy is widely used in the development of novel antimicrobial testing in vitro. |
| Databáze: | OpenAIRE |
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