Resonance shifting by ferrite thick film superstrate
| Autor: | Vijaya Puri, Shrihar Mathad, M. K. Rendale |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Computer Networks and Communications business.industry Mechanical Engineering Energy Engineering and Power Technology penetration depth 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Hardware and Architecture Control and Systems Engineering thick films 0103 physical sciences Optoelectronics Ferrite (magnet) lcsh:Electrical engineering. Electronics. Nuclear engineering Electrical and Electronic Engineering 0210 nano-technology business complex permittivity lcsh:TK1-9971 microstrip ring resonator (MSRR) |
| Zdroj: | Serbian Journal of Electrical Engineering, Vol 15, Iss 3, Pp 275-284 (2018) |
| ISSN: | 2217-7183 1451-4869 |
| Popis: | Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing technique on alumina substrates. Structural analysis was undertaken using X-ray diffraction and Scanning electron microscopy techniques. A new approach for the determination of complex permittivity (?' and ?'' ) using microwave property perturbation is unveiled. Ag thick film microstrip ring resonator (MSRR) with and without the thick film substrate was used for the microwave transmission studies in the frequency region of 8-12 GHz. The microwave conductivity of the thick films lies in the range of 1.779 S/cm to 2.296 S/cm. The penetration depth is also reported within the X-band of microwave frequencies. |
| Databáze: | OpenAIRE |
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