A general methodology for calculating mixed mode stress intensity factors and fracture toughness of solder joints with interfacial cracks
Autor: | Indranath Dutta, Z. Huang, Praveen Kumar, John H. L. Pang, Rajen S. Sidhu |
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Rok vydání: | 2014 |
Předmět: |
Strain energy release rate
Materials science Mechanical Engineering Crack tip opening displacement Materials Engineering (formerly Metallurgy) Fracture mechanics Fracture toughness Mechanics of Materials Fracture (geology) General Materials Science Displacement (orthopedic surgery) Composite material Joint (geology) Stress intensity factor |
Zdroj: | Engineering Fracture Mechanics. 131:9-25 |
ISSN: | 0013-7944 |
DOI: | 10.1016/j.engfracmech.2014.10.003 |
Popis: | Solder joints in electronic packages undergo thermo-mechanical cycling, resulting in nucleation of micro-cracks, especially at the solder/bond-pad interface, which may lead to fracture of the joints. The fracture toughness of a solder joint depends on material properties, process conditions and service history, as well as strain rate and mode-mixity. This paper reports on a methodology for determining the mixed-mode fracture toughness of solder joints with an interfacial starter-crack, using a modified compact mixed mode (CMM) specimen containing an adhesive joint. Expressions for stress intensity factor (K) and strain energy release rate (G) are developed, using a combination of experiments and finite element (FE) analysis. In this methodology, crack length dependent geometry factors to convert for the modified CMM sample are first obtained via the crack-tip opening displacement (CTOD)-based linear extrapolation method to calculate the under far-field mode I and II conditions (f(1a) and f(2a)), (ii) generation of a master-plot to determine a(c), and (iii) computation of K and G to analyze the fracture behavior of joints. The developed methodology was verified using J-integral calculations, and was also used to calculate experimental fracture toughness values of a few lead-free solder-Cu joints. (C) 2014 Elsevier Ltd. All rights reserved. |
Databáze: | OpenAIRE |
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