Developing models for Type-N coaxial VNA calibration kits within the NIST Microwave Uncertainty Framework

Autor: Jargon, Jeffrey A., Williams, Dylan F., Hale, Paul D.
Rok vydání: 2016
Zdroj: 2016 87th ARFTG Microwave Measurement Conference (ARFTG).
DOI: 10.1109/arftg.2016.7501944
Popis: n/a
Databáze: OpenAIRE