Developing models for Type-N coaxial VNA calibration kits within the NIST Microwave Uncertainty Framework
Autor: | Jargon, Jeffrey A., Williams, Dylan F., Hale, Paul D. |
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Rok vydání: | 2016 |
Zdroj: | 2016 87th ARFTG Microwave Measurement Conference (ARFTG). |
DOI: | 10.1109/arftg.2016.7501944 |
Popis: | n/a |
Databáze: | OpenAIRE |
Externí odkaz: |