fastSIM: a practical implementation of fast structured illumination microscopy
| Autor: | Hui-Wen Lu-Walther, Martin Kielhorn, Kai Wicker, Aurélie Jost, Rainer Heintzmann, Ronny Förster |
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| Rok vydání: | 2015 |
| Předmět: |
Materials science
Spatial light modulator business.industry media_common.quotation_subject Polarizer Frame rate Atomic and Molecular Physics and Optics law.invention Liquid crystal on silicon symbols.namesake Fourier transform Optics Data acquisition Filter (video) law symbols Contrast (vision) General Materials Science business Instrumentation Spectroscopy media_common |
| Zdroj: | Methods and Applications in Fluorescence. 3:014001 |
| ISSN: | 2050-6120 |
| DOI: | 10.1088/2050-6120/3/1/014001 |
| Popis: | A significant improvement in acquisition speed of structured illumination microscopy (SIM) opens a new field of applications to this already well-established super-resolution method towards 3D scanning real-time imaging of living cells. We demonstrate a method of increased acquisition speed on a two-beam SIM fluorescence microscope with a lateral resolution of ~100 nm at a maximum raw data acquisition rate of 162 frames per second (fps) with a region of interest of 16.5 × 16.5 µm2, free of mechanically moving components. We use a programmable spatial light modulator (ferroelectric LCOS) which promises precise and rapid control of the excitation pattern in the sample plane. A passive Fourier filter and a segmented azimuthally patterned polarizer are used to perform structured illumination with maximum contrast. Furthermore, the free running mode in a modern sCMOS camera helps to achieve faster data acquisition. |
| Databáze: | OpenAIRE |
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