The Fe/NiO interface studied by polarization dependent X – ray absorption spectroscopy
| Autor: | Colonna S. (1), Luches P. (2), Valeri S. (2, Boscherini F. (4) |
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| Přispěvatelé: | S. Colonna, P. Luche, S. Valeri, F. Boscherini |
| Jazyk: | angličtina |
| Rok vydání: | 2006 |
| Předmět: |
RADIAZIONE DI SINCROTRONE
Nuclear and High Energy Physics X-ray absorption spectroscopy Materials science Extended X-ray absorption fine structure Non-blocking I/O Analytical chemistry INTERFACCE Fe/NiO interface Tetragonal crystal system Planar Perpendicular Absorption (electromagnetic radiation) Instrumentation Layer (electronics) |
| Zdroj: | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms 246 (2006): 131–135. doi:10.1016/j.nimb.2005.12.025 info:cnr-pdr/source/autori:Colonna S. (1), Luches P. (2), Valeri S. (2,3), Boscherini F. (4)/titolo:The Fe%2FNiO interface studied by polarization dependent X-ray absorption spectroscopy/doi:10.1016%2Fj.nimb.2005.12.025/rivista:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (Print)/anno:2006/pagina_da:131/pagina_a:135/intervallo_pagine:131–135/volume:246 |
| DOI: | 10.1016/j.nimb.2005.12.025 |
| Popis: | In order to provide a structural basis for the modelling of the electronic and magnetic properties of the Fe/NiO(001) interface we have performed polarization dependent Fe K-edge X-ray absorption measurements. A multi-shell fit of the data is presented and discussed. We find that a 2 ML Fe film exhibits a complete tetragonal distortion of the unit cell and demonstrate the formation of a planar FeO layer with expanded Fe-O distances perpendicular to the growth plane. We discuss a model for the interface with the FeO layer at the oxide-metal interface. At 10 ML thickness the tetragonal strain of the Fe film is partially released. (c) 2005 Elsevier B.V. All rights reserved. |
| Databáze: | OpenAIRE |
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