Determination of the extinction coefficient of dielectric thin films from spectrophotometric measurements
| Autor: | Emile Pelletier, Jean-Pierre Borgogno |
|---|---|
| Rok vydání: | 1989 |
| Předmět: |
Materials science
medicine.diagnostic_test business.industry Materials Science (miscellaneous) Dielectric Molar absorptivity Industrial and Manufacturing Engineering Photometry (optics) Optics Spectrophotometry medicine Transmittance Business and International Management Thin film Reflection coefficient business Refractive index |
| Zdroj: | Applied Optics. 28:2895 |
| ISSN: | 1539-4522 0003-6935 |
| DOI: | 10.1364/ao.28.002895 |
| Popis: | Data obtained from reflectance and transmittance measurements are used to determine the extinction coefficient. We show that accuracy is limited by the substrate quality and interface roughnesses of the layer. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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