TCT and test beam results of irradiated magnetic Czochralski silicon (MCz-Si) detectors

Autor: Teppo Mäenpää, Eija Tuominen, H. Moilanen, Leonard Spiegel, Esa Tuovinen, Burton Betchart, M. Frey, Sandor Czellar, Jorma Tuominiemi, Panja-Riina Luukka, Tapio Lampén, Matti J Kortelainen, Hans-Jürgen Simonis, Frank Hartmann, Y. Gotra, Otilia Militaru, T. Liamsuwan, Vincent Lemaitre, A. Furgeri, S. Korjenevski, Regina Demina, Jaakko Härkönen, B. Ledermann
Rok vydání: 2009
Předmět:
Zdroj: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 604:254-257
ISSN: 0168-9002
Popis: Pad and strip detectors processed on high resistivity n-type magnetic Czochralski silicon (MCz-Si) were irradiated to several different fluences with protons. The pad detectors were characterized with the transient current technique (TCT) and the full-size strip detectors with a reference beam telescope and a 225GeV muon beam. The TCT measurements indicate a double junction structure and space charge sign inversion in MCz-Si detectors after $6 \times 10^{14} \ 1 \ \rm{MeV} n_{eq}/cm^2$ fluence. In the beam test a signal-to-noise ($S/N$) ratio of 50 was measured for a non-irradiated MCz-Si sensor, and a $S/N$ ratio of 20 for the sensors irradiated to the fluences of $1 \times 10^{14} \ 1$ and $5 \times 10^{14} \ 1 \ \rm{MeV} n_{eq}/cm^2$.
Databáze: OpenAIRE