Work function shifts of catalytic metals under hydrogen gas visualized by terahertz chemical microscopy
| Autor: | Mitsuhiro Shinomiya, Takafumi Hagiwara, Keiji Tsukada, Kenji Sakai, Toshihiko Kiwa |
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| Rok vydání: | 2012 |
| Předmět: |
Microscopy
Materials science Hydrogen Terahertz radiation business.industry chemistry.chemical_element Biasing Nanotechnology Atomic and Molecular Physics and Optics Catalysis Optics Terahertz Imaging chemistry Energy Transfer Metals Electrode Sapphire Optoelectronics Work function Thin film business |
| Zdroj: | Optics express. 20(11) |
| ISSN: | 1094-4087 |
| Popis: | Terahertz chemical microscopy (TCM) was applied to visualize the distribution of the work function shift of catalytic metals under hydrogen gas. TCM measures the chemical potential on the surface of a SiO(2)/Si/sapphire sensing plate without any contact with the plate. By controlling the bias voltage between an electrode on the SiO(2)/ surface and the Si layer, the relationship between the voltage and the THz amplitude from the sensing plate can be obtained. As a demonstration, two types of structures were fabricated on the sensing plate, and the work function shifts due to catalytic reactions were visualized. |
| Databáze: | OpenAIRE |
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