Slot-loaded patches with a switching mechanism to extend the scanning range of a phased array subject to scan blindness

Autor: Renaud Loison, Isabelle Le Roy-Naneix, Christian Renard, Aurelien Ayissi Manga, Raphaël Gillard
Přispěvatelé: Institut d'Électronique et des Technologies du numéRique (IETR), Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), THALES Airborne Systems [Elancourt], THALES [France], Université de Nantes (UN)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), THALES, Institut d'Electronique et de Télécommunications de Rennes ( IETR ), Université de Nantes ( UN ) -Université de Rennes 1 ( UR1 ), Université de Rennes ( UNIV-RENNES ) -Université de Rennes ( UNIV-RENNES ) -Institut National des Sciences Appliquées - Rennes ( INSA Rennes ) -CentraleSupélec-Centre National de la Recherche Scientifique ( CNRS ), THALES SYSTEMES AEROPORTES, Laboratoire de Génie Electrique de Grenoble ( G2ELab ), Université Joseph Fourier - Grenoble 1 ( UJF ) -Institut polytechnique de Grenoble - Grenoble Institute of Technology ( Grenoble INP ) -Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Centre National de la Recherche Scientifique ( CNRS ) -Université Grenoble Alpes ( UGA ) -Université Joseph Fourier - Grenoble 1 ( UJF ) -Institut polytechnique de Grenoble - Grenoble Institute of Technology ( Grenoble INP ) -Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Centre National de la Recherche Scientifique ( CNRS ) -Université Grenoble Alpes ( UGA ), Nantes Université (NU)-Université de Rennes 1 (UR1)
Rok vydání: 2018
Předmět:
Computer science
Phased array
[ INFO.INFO-NI ] Computer Science [cs]/Networking and Internet Architecture [cs.NI]
Impedance matching
Topology (electrical circuits)
02 engineering and technology
Antenna array
[INFO.INFO-NI]Computer Science [cs]/Networking and Internet Architecture [cs.NI]
Optics
0202 electrical engineering
electronic engineering
information engineering
Range (statistics)
coupling
Electrical and Electronic Engineering
Coupling
business.industry
020208 electrical & electronic engineering
020206 networking & telecommunications
Condensed Matter Physics
Atomic and Molecular Physics
and Optics
[ SPI.TRON ] Engineering Sciences [physics]/Electronics
[SPI.TRON]Engineering Sciences [physics]/Electronics
Electronic
Optical and Magnetic Materials
Mechanism (engineering)
antenna array
Proof of concept
scan blindness
business
Zdroj: Microwave and Optical Technology Letters
Microwave and Optical Technology Letters, 2018, 60 (6), pp.1410-1417. ⟨10.1002/mop.31177⟩
Microwave and Optical Technology Letters, Wiley, 2018, 60 (6), pp.1410-1417. ⟨10.1002/mop.31177⟩
Microwave and Optical Technology Letters, Wiley, 2018, 60 (6), pp.1410-1417. 〈10.1002/mop.31177〉
ISSN: 0895-2477
1098-2760
DOI: 10.1002/mop.31177
Popis: International audience; This article presents a novel solution to extend the scanning range of a cavity-backed stacked-patch phased array whose performances are limited by scan blindness. Two main aspects are investigated. The first section is a thorough description of the scan blindness mechanism and the associated mutual coupling scheme occurring in the reported array. The second section introduces a revised array topology that allows extending the scanning range up to the blind angle. The article focuses on the proof of concept of the proposed solution, which is based on the switching between two operating modes of the structure, each one covering a part of a globally wider scanning range. In the present case, the scanning capability of the array has been extended by 10 degrees in the scanning plane of interest. Besides, the restored impedance matching allows for a 2 dBi gain improvement at the scan blindness angle.
Databáze: OpenAIRE
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