Epitaxial growth of atomically thin Ga2Se2 films on c-plane sapphire
Autor: | Yu, Mingyu, Murray, Lottie, Doty, Matthew, Law, Stephanie |
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Rok vydání: | 2022 |
Předmět: | |
DOI: | 10.5281/zenodo.7459828 |
Popis: | This repository contains experimental data for the following paper: Epitaxial Growth of Atomically Thin Ga2Se2 Films on C-plane Sapphire. Authors: M. Y. Yu, L. Murray, M. Doty, and S. Law. Content of this repository: Readme file. /RawData/ Original data obtained at the time of measurements for atomic force microscopy (AFM), raman spectroscopy, reflection high-energy diffraction (RHEED), scanning electron microscopy (SEM) and X-ray diffraction (XRD). /Measurement notes/ All the measurement devices, parameters and the approaches to process the AFM images were summarized in powerpoints, catagorized by the name of the device. /Data of paper figures/ All the organized figures in the main text and supplementary information, and all the organized data files for the figures. Data file types: data.spm - the original data file obtained at the time of the AFM experiments using Bruker Dimesion Icon data.gsf - the original data file obtained at the time of the AFM experiments using NeaSNOM data.txt - the original data file obtained at the time of the XRD and raman experiments data.tif - the original data file obtained at the time of the SEM measurements The data.spm and data.gsf files need to be opened using Gwyddion. The authors acknowledge funding from the Coherent/ II-VI Foundation. |
Databáze: | OpenAIRE |
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