Autor: |
Winfried Teizer, R. C. Dynes, Frances Hellman |
Rok vydání: |
2003 |
Předmět: |
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Zdroj: |
Physica E: Low-dimensional Systems and Nanostructures. 18:266-269 |
ISSN: |
1386-9477 |
DOI: |
10.1016/s1386-9477(02)01011-1 |
Popis: |
We have measured the Hall effect in 3-d amorphous Gd x Si 1− x films in the critical regime of the metal–insulator transition (MIT) at T=400 mK . a-Gd x Si 1− x exhibits a large negative magnetoresistance which is independent of the orientation of the magnetic field H with respect to the film and allows an in situ tuning of the conductivity through the MIT with H . We find an electron-like Hall coefficient R H . As the material becomes less metallic, R H increases. We find that R H is a critical quantity with critical exponent ∼−1 (R H ∼(H−H C ) −1 ) . |
Databáze: |
OpenAIRE |
Externí odkaz: |
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