Characterization by X-Ray Diffraction of Non- $c$ -Axis Epitaxial ${Bi}_{2}{Sr}_{2}{CaCu}_{2}{O}_{8+\delta}$ Thin Films
| Autor: | I. Tsuyumoto, Yasushi Tateno, T. Kaneko, S. Arisawa, Petre Badica, Kazuhiro Endo |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science High-temperature superconductivity Condensed Matter Physics Epitaxy 01 natural sciences Electronic Optical and Magnetic Materials Characterization (materials science) law.invention Crystallography Impurity law 0103 physical sciences X-ray crystallography Metalorganic vapour phase epitaxy Electrical and Electronic Engineering Thin film 010306 general physics Crystal twinning |
| Zdroj: | IEEE Transactions on Applied Superconductivity. 26:1-4 |
| ISSN: | 1558-2515 1051-8223 |
| Popis: | Thin films of Bi 2 Sr 2 CaCu 2 O 8 (Bi-2212) with the non-c-axis (117) orientation were grown by MOCVD on (110) LaAlO 3 single crystal substrate. XRD θ - 2θ scans show that films contain also (119) and (011)Bi-2212 impurity grains. We propose and report characterization of the non-c-axis films by XRD φ - ψ scans. By this approach, the assumed theoretical film-substrate relationship of the (117) Bi-2212 grains is demonstrated experimentally. The result also confirms twinning in the span rooflike (117) Bi-2212 grains. The impurity (119) and (011) Bi-2212 grains are also rooflike and in-plane aligned according to film-substrate relation and AFM images so that the film can be considered in-plane epitaxial. |
| Databáze: | OpenAIRE |
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