Simulation of integrated circuit immunity with LECCS model

Autor: O. Wada, I. Iwase, Kouji Ichikawa, Yukihiko Sakurai, M. Inagaki, Makoto Nagata
Rok vydání: 2006
Předmět:
Zdroj: 2006 17th International Zurich Symposium on Electromagnetic Compatibility.
DOI: 10.1109/emczur.2006.214932
Popis: We have been developing an LSI model for EMC simulation in electronic control units. EMI simulations have been applied to some units using an LSI EMI model. These models have been called the LECCS Model and ICEM Model, but there are few examples of EMS simulation in printed circuit boards. Therefore , we studied the LSI EMS model and attempted to perform an EMS simulation of a printed circuit board. The LSI was tested through the DPI method (IEC61967-4). The EMS in this test system was analyzed, and the usefulness of this method of analysis was confirmed. The analysis was also applied to a product.
Databáze: OpenAIRE