| Autor: |
Mango C.-T. Chao, Yung-Chen Chen, Kai-Chiang Wu, Yi-Lun Tang, Yu-Pang Hu, Ming-Chien Chen, Fu-Sheng Huang, Shuo-Wen Chang, Chi Chun Wang |
| Rok vydání: |
2020 |
| Předmět: |
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| Zdroj: |
ITC-Asia |
| Popis: |
A defect-based bridge fault represents the faulty behavior of an interconnect short defect obtained by SPICE-simulating the two shorted cells with the short defect injected. In this paper, we have developed a framework to automatically extract defect-based bridge faults and utilize commercial ATPG to generate corresponding test patterns for a given design. Defect-based bridge fault model can not only describe the faulty behavior of a short defect precisely but also result in collapsible faults at one shorted cell pair. As a result, using defect-based bridge fault model for ATPG can lead to a significantly smaller bridge-fault test set when compared to conventional 4-way dominance bridge fault model, where four non-collapsible faults at one shorted cell pair are considered for ATPG. Also, some short defects can only be detected by the test set for defect-based bridge faults but not by the test set for 4-way dominance bridge faults with more test patterns. The experimental result based on industrial designs has demonstrated the effectiveness of using defect-based bridge faults for ATPG while showing an affordable runtime on extracting defect-based bridge faults. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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