Dynamical X‐ray diffractometry of the defect structure of garnet crystals
| Autor: | V. M. Pylypiv, Ye. M. Kyslovskyy, V. B. Molodkin, V. V. Lizunov, T. P. Vladimirova, B. K. Ostafiychuk, I. M. Fodchuk, O. S. Skakunova, O. Z. Garpul, O. V. Reshetnyk, S. I. Olikhovskii |
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| Rok vydání: | 2011 |
| Předmět: |
Diffraction
Materials science Condensed matter physics X-ray Physics::Optics Gadolinium gallium garnet Surfaces and Interfaces Condensed Matter Physics Crystallographic defect Surfaces Coatings and Films Electronic Optical and Magnetic Materials Characterization (materials science) Crystal chemistry.chemical_compound Crystallography chemistry X-ray crystallography Materials Chemistry Electrical and Electronic Engineering Single crystal |
| Zdroj: | physica status solidi (a). 208:2558-2562 |
| ISSN: | 1862-6319 1862-6300 |
| DOI: | 10.1002/pssa.201184254 |
| Popis: | The generalized statistical dynamical theory of X-ray diffraction by imperfect single crystals is applied for the structural characterization of real single crystals with complex basis, namely, gadolinium gallium garnet (GGG) crystal Gd3Ga5O12. The developed theoretical approach takes into account the presence of various structural defects as well as provides the self-consistent description of coherent and diffuse components of diffraction profiles from such crystals. The characteristics of microdefects in the investigated GGG single crystal have been determined by analyzing the rocking curves measured for 444 and 888 reflections of CuKα1 radiation. |
| Databáze: | OpenAIRE |
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