Refractive index profiles of ion implanted waveguides in thulium sodium yttrium tungstate
| Autor: | Hui Hu, Fei Lu, Feng Chen, Feng-Xiang Wang, Ding-Yu Shen, Ke-Ming Wang, Huanchu Chen, Zhenxiang Cheng, Bo-Rong Shi |
|---|---|
| Rok vydání: | 2001 |
| Předmět: |
Materials science
business.industry Analytical chemistry chemistry.chemical_element Refractive index profile Yttrium Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Ion chemistry.chemical_compound Optics Ion implantation Thulium chemistry Tungstate Ternary compound Sodium tungstate Electrical and Electronic Engineering Physical and Theoretical Chemistry business |
| Zdroj: | Optics Communications. 200:179-185 |
| ISSN: | 0030-4018 |
| DOI: | 10.1016/s0030-4018(01)01657-1 |
| Popis: | Planar waveguides were first formed in thulium sodium yttrium tungstate (Tm:NaY(WO 4 ) 2 ) crystals by the implantation of MeV He, P and Ni ions with certain doses at room temperature, respectively. The refractive index profiles of the three ion implanted waveguides were found different to some extent. The present data show that He + ion implanted waveguides in Tm:NaY(WO 4 ) 2 should be the typical barrier type one, while a combination of radiation damage and radiation enhanced diffusion may be responsible for the refractive index profiles of the MeV Ni + and P + ion implanted waveguides in Tm:NaY(WO 4 ) 2 . |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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