Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS)

Autor:	Olga S. Ovchinnikova, Artem A. Trofimov, Alex Belianinov, Matthias Lorenz, Anton V. Ievlev, Stephen T. King
Rok vydání:	2019
Předmět:	chemistry.chemical_classification Secondary ion mass spectrometry Materials science chemistry Analytical chemistry chemistry.chemical_element Polymer Ion microscopy Instrumentation Helium
Zdroj:	Microscopy and Microanalysis. 25:868-869
ISSN:	1435-8115 1431-9276
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f6373b09876aba8ccf7723b1398abab7 https://doi.org/10.1017/s1431927619005075 Zobrazit plný text záznamu