| Autor: |
J. Sebastian, Harald König, Petra Hennig, Marc Philippens, M. Schröder, J. Meusel, D. Lorenzen, R. Hülsewede |
| Rok vydání: |
2006 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.659047 |
| Popis: |
This paper is mainly dedicated to a short-time scale reliability study of different packages applied to the same type of laser diode bars: indium and gold-tin packaged laser bars are operated in cw hard-pulse mode with increasing currents until their destruction. The destruction currents serve as guide values for long-time aging tests that should be performed at lower currents. Gold-tin packaged diode lasers turn out to have clearly higher destruction currents in hard-pulse mode. This result is underlined by long-time aging tests at appropriate currents. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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