Analysis of defect propagation in the product development process based on key activity nodes

Autor: Weidong Liu, Chengdi Xiao, Huimeng Zheng, Wenbin Nie
Rok vydání: 2017
Předmět:
Zdroj: Quality Engineering. 30:485-497
ISSN: 1532-4222
0898-2112
DOI: 10.1080/08982112.2017.1353096
Popis: Design defects do not only degrade the quality of products, but also overrun budgets, extend schedules, and even jeopardize the success of product development (PD). Defect propagation result in a h...
Databáze: OpenAIRE