Analysis of defect propagation in the product development process based on key activity nodes
Autor: | Weidong Liu, Chengdi Xiao, Huimeng Zheng, Wenbin Nie |
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Rok vydání: | 2017 |
Předmět: |
0209 industrial biotechnology
Engineering business.industry media_common.quotation_subject 02 engineering and technology Industrial and Manufacturing Engineering Reliability engineering 020901 industrial engineering & automation New product development 0202 electrical engineering electronic engineering information engineering Key (cryptography) 020201 artificial intelligence & image processing Quality (business) Safety Risk Reliability and Quality business media_common |
Zdroj: | Quality Engineering. 30:485-497 |
ISSN: | 1532-4222 0898-2112 |
DOI: | 10.1080/08982112.2017.1353096 |
Popis: | Design defects do not only degrade the quality of products, but also overrun budgets, extend schedules, and even jeopardize the success of product development (PD). Defect propagation result in a h... |
Databáze: | OpenAIRE |
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