Impact of Hot Carrier Injection on Total Ionizing Dose Effect of 10-nm N-channel Bulk FinFETs
| Autor: | Pritam Yogi, Manoj Kumar, Kritika Aditya, Charu Gupta, Abhisek Dixit |
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| Rok vydání: | 2020 |
| Zdroj: | 2020 5th IEEE International Conference on Emerging Electronics (ICEE). |
| DOI: | 10.1109/icee50728.2020.9776895 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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