Process Modeling as a Powerful Semiconductor Industry Tool: PVD of W as Case Study

Autor: Piyush Bhatt, Wei Lei, Shirish Pethe, Rajesh Sathiyanarayanan, Phillip Stout
Rok vydání: 2022
Zdroj: 2022 IEEE International Conference on Emerging Electronics (ICEE).
DOI: 10.1109/icee56203.2022.10117770
Databáze: OpenAIRE