Semiconductor yield loss' causes identification: A data mining approach

Autor:	P. Beaune, David Rozier, R. Le Riche, H. Barkia, Xavier Boucher, Marie-Agnès Girard
Rok vydání:	2013
Předmět:	Identification (information) Engineering business.industry Yield (finance) Data mining business computer.software_genre computer
Zdroj:	2013 IEEE International Conference on Industrial Engineering and Engineering Management.
DOI:	10.1109/ieem.2013.6962530
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::edcbb197c8d01b11171fa334f30d7d0f https://doi.org/10.1109/ieem.2013.6962530 Zobrazit plný text záznamu