Design and test of large embedded memories: An overview

Autor:	R. Rajsuman
Rok vydání:	2001
Předmět:	Engineering Random access memory Hardware_MEMORYSTRUCTURES business.industry Memory redundancy Test (assessment) Hardware and Architecture Test algorithm Embedded system Hardware_INTEGRATEDCIRCUITS Electronic design automation Electrical and Electronic Engineering business Software
Zdroj:	IEEE Design & Test of Computers. 18:16-27
ISSN:	0740-7475
DOI:	10.1109/54.922800
Popis:	Large on-chip memories are desirable but difficult to implement. Challenges range from design automation to fabrication to test algorithms and memory redundancy and repair.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ed35ae616beaa9162480ebb7a8239fba https://doi.org/10.1109/54.922800 Zobrazit plný text záznamu