Optimisation of X-ray micro-tomography for the low-dose analysis of highly-dosed gels

Autor:	E C Atkinson, P Wai, S J Doran, P M Jenneson
Rok vydání:	2004
Předmět:	Physics History Scanner business.industry Low dose X-ray Image intensifier Micro tomography Radiation Computer Science Applications Education law.invention Optics law Perpendicular business Beam (structure)
Zdroj:	Journal of Physics: Conference Series. 3:257-260
ISSN:	1742-6596 1742-6588
DOI:	10.1088/1742-6596/3/1/041
Popis:	An X-ray micro-tomography system has been designed that is optimised for low dose imaging of radiation sensitive polymer gels. The scanner is based on a third-generation cone-beam X-ray CT scanner. A mini-focus X-ray source (Oxford XTF5011 or an Oxford series 1500) is used in conjunction with a 100mm diameter X-ray image intensifier (Hamamatsu C7336). The sample may be rotated and moved perpendicular to the beam axis.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::eb385591b314071b5766d1684fdabbb6 https://doi.org/10.1088/1742-6596/3/1/041 Zobrazit plný text záznamu