Infared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films
| Autor: | Randolph E. Treece, H.R. Moutinho, M. Dalberth, Charles T. Rogers, J.D. Webb, L.L. Kazmerski, Carl H. Mueller, T. V. Rivkin |
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| Rok vydání: | 1997 |
| Předmět: |
Copper oxide
Materials science Absorption spectroscopy Analytical chemistry Infrared spectroscopy Condensed Matter Physics Ferroelectricity Electronic Optical and Magnetic Materials chemistry.chemical_compound chemistry Control and Systems Engineering Lanthanum aluminate X-ray crystallography Materials Chemistry Ceramics and Composites Strontium titanate Electrical and Electronic Engineering Fourier transform infrared spectroscopy |
| Zdroj: | Integrated Ferroelectrics. 15:9-18 |
| ISSN: | 1607-8489 1058-4587 |
| Popis: | Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the {nu}{sub 3} and {nu}{sub 4} phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm{sup {minus}1}. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and the substrates for comparison. Softening in the frequency of the {nu}{sub 4} transverse optical phonon in the lattice- mismatched films below the established value of 544 cm{sup {minus}1} is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results. |
| Databáze: | OpenAIRE |
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